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Multi-convergence-angle ptychography with simultaneous strong contrast and high resolution

arXiv

2024

Mao, W.; Zhang, W.; Huang, C.; Zhou, L.; Kim, J. S.; Gao, S.; Lei, Y.; Wu, X.; Hu, Y.; Pei, X.; Fang, W.; Liu, X.; Song, J.; Fan, C.; Nie, Y.; Kirkland, A. I.; Wang, P.

Probing oxidation-driven amorphized surfaces in a Ta(110) film for superconducting qubit

ACS Nano

2023

Mun, J.; Sushko, P. V.; Brass, E.; Zhou, C.; Kisslinger, K.; Qu, X.; Liu, M.; Zhu, Y.

Reassessing chain tilt in the lamellar crystals of polyethylene

2023

Kanomi, S.; Marubayashi, H.; Miyata, T.; Jinnai, H.

Reassessing chain tilt in the lamellar crystals of polyethylene

Nature Communications

2023

Kanomi, S.; Marubayashi, H.; Miyata, T.; Jinnai, H.

Nanoscale mapping of point defects with 4D-STEM

Research Square

2022

Minor, A.; Mills, S.; Zeltmann, S.; Ercius, P.; Kohnert, A.; Uberuaga, B.

High-density switchable skyrmion-like polar nanodomains integrated on silicon

Nature

2022

Han, L.; Addiego, C.; Prokhorenko, S.; Wang, M.; Fu, H.; Nahas, Y.; Yan, X.; Cai, S.; Wei, T.; Fang, Y.; Liu, H.; Ji, D.; Guo, W.; Gu, Z.; Yang, Y.; Wang, P.; Bellaiche, L.; Chen, Y.; Wu, D.; Nie, Y.; Pan, X.

Cryogenic 4D-STEM analysis of an amorphous-crystalline polymer blend: combined nanocrystalline and amorphous phase mapping

iScience

2022

Donohue, J.; Zeltmann, S. E.; Bustillo, K. C.; Savitzky, B.; Jones, M. A.; Meyers, G.; Ophus, C.; Minor, A. M.

Disentangling multiple scattering with deep learning: application to strain mapping from electron diffraction patterns

arXiv

2022

Munshi, J.; Rakowski, A.; Savitzky, B. H.; Zeltmann, S. E.; Ciston, J.; Henderson, M.; Cholia, S.; Minor, A. M.; Chan, M. K. Y.; Ophus, C.

Automated crystal orientation mapping in py4DSTEM using sparse correlation matching

arXiv

2021

Ophus, C.; Zeltmann, S. E.; Bruefach, A.; Rakowski, A.; Savitzky, B. H.; Minor, A. M.; Scott, M. C.

Strain fields in twisted bilayer graphene

Nature Materials

2021

Kazmierczak, N. P.; Van Winkle, M.; Ophus, C.; Bustillo, K. C.; Carr, S.; Brown, H. G.; Ciston, J.; Taniguchi, T.; Watanabe, K,; Bediako, D. K.

Local lattice deformation of tellurene grain boundaries by four-dimensional electron microscopy

Journal of Physical Chemistry C

2021

Londoño-Calderon, A.; J. Williams, D. J.; Schneider, M.; Savitzky, B. H.; Ophus, C.; Pettes, M. T.

Spatial mapping of electrostatics and dynamics across 2D heterostructures

Condensed Matter

2020

Murthy, A. A.; Stanev, T. K.; Ribet, S. M.; Liu, P.; Watanabe, K.; Taniguchi, T.; Stern, N. P.; dos Reis, R.; Dravid, V. P.

Thickness and defocus dependence of inter-atomic electric fields measured by scanning diffraction

Ultramicroscopy

2020

Addiego, C.; Gao, W.; Pan, X.

Real-space charge-density imaging with sub-ångstrom resolution by four-dimensional electron microscopy

Nature

2019

Gao, W.; Addiego, C.; Wang, H,; Yan, X.; Hou, Y.; Ji, D.; Heikes, C.; Zhang, Y.; Li, L.; Huyan, H.; Blum, T.; Aoki, T.; Nie, Y.; Schlom, D.; Wu, R.; Pan, X.

Nanoscale mosaicity revealed in peptide microcrystals by scanning electron nanodiffraction

Communications Biology

2019

Gallagher-Jones, M.; Ophus, C.; Bustillo, K. C.; Boyer, D. R.; Panova, O.; Glynn, C.; Zee, C., -T.; Ciston, J.; Mancia, K. C.; Minor, A. M.; Rodriguez, J. A.

Probing light atoms at sub-nanometer resolution: Realization of scanning transmission electron microscope holography

Cornell University Library

2018

Yasin, F. S.; Harvey, T. R.; Chess, J. J.; Pierce, J. S.; Ophus, C.; Ercius, P.; McMorran, B. J.

Local nanoscale strain mapping of a metallic glass during in situ testing

Applied Physics Letters

2018

Gammer, C.; Ophus, C.; Pekin, T. C.; Eckert, J.; Minor, A. M.

In situ nanobeam electron diffraction strain mapping of planar slip in stainless steel

Scripta Materialia

2017

Pekin, T. C.; Gammer, C.; Ciston, J.; Ophus, C.; Minor, A. M.

Non-spectroscopic composition measurements of SrTiO3-La0.7Sr0.3MnO3 multilayers using scanning convergent beam electron diffraction

Applied Physics Letters

2017

Ophus, C.; Ercius, P.; Huijben, M.; Ciston, J.

Local and transient nanoscale strain mapping during in situ deformation

Applied Physics Letters

2016

Gammer, C.; Kacher, J.; Czarnik, C.; Warren, O. L.; Ciston, J.; Minor, A. M.

Practical aspects of diffractive imaging using an atomic-scale coherent electron probe

Ultramicroscopy

2016

Chen, Z.; Weyland, M.; Ercius, P.; Ciston, J.; Zheng, C.; Fuhrer, M. S.; D'Alfonso. A. J.; Allen, L. J.; Findlay, S. D.

Highly mobile ferroelastic domain walls in compositionally graded ferroelectric thin films

Nature Materials

2016

Agar, J. C.; Damodaran, A. R.; Okatan, M. B.; Kacher, J.; Gammer, C.; Vasudevan, R. K.; Pandya, S.; Dedon, L. R.; Mangalam, R. V. K.; Velarde, G. A.; Jesse, S.; Balke, N.; Minor, A. M.; Kalinin, S. V.; Martin, L. W.

Diffraction contrast imaging using virtual apertures

Ultramicroscopy

2015

Gammer, C.; Ozdol, V. B.; Liebscher, C. H.; Minor, A. M.

Strain mapping at nanometer resolution using advanced nano-beam electron diffraction

Applied Physics Letters

2015

Ozdol, V. B.; Gammer,C.; Jin, X. G.; Ercius, P.; Ophus, C.; Ciston,J.; Minor, A. M.