Image Sample Data

Better resolve faint, high-resolution diffraction spots with ClearView Frame Control mode

$Better resolve faint, high-resolution diffraction spots with ClearView Frame Control mode$

Enabling Frame Control mode allows users to better leverage the full dynamic range of the camera and maximize the signal-to-noise in acquired images by reducing the camera framerate and minimizing the total readout noise in an image. The left image shows a selected area electron diffraction pattern of a Si [110] sample. Frame Control mode was used to optimize the signal-to-noise. The diffraction pattern was a 1s acquisition at 4 fps and 4k x 4k resolution. The middle image shows an inset area of the diffraction pattern, showing faint diffraction spots. Spot #1 in particular is very faint.

High signal-to-noise TEM imaging with ClearView Frame Control mode

Enabling Frame Control mode allows users to better leverage the full dynamic range of the camera and maximize the signal-to-noise in acquired images by reducing the camera framerate and minimizing the total readout noise in an image. The left and middle images show a 2 s image acquisition captured at 4k x 4k resolution and 50 fps. These images provide high levels of detail from the semiconductor sample being imaged. The right image utilizes Frame Control mode to capture a 2 s image at 4k x 4k resolution and 1 fps and shows the same inset area.

Live drift correction during imaging acquisition

ClearView can acquire images up to 30 s total capture time and apply a live drift correction to remove the effects of spatial drift. Utilizing live drift correction enables high-resolution data acquisition even with sample drift.

Images acquired with a ClearView camera at 4k x 4k resolution and 200 kV.

HRTEM imaging of MgCrMnO4 material for lithium-ion batteries. Image captured with ClearView camera at 4k x 4k resolution and at 200 kV.

High-resolution imaging of lithium-ion battery materials

HRTEM Imaging of MgCrMnO4 material for lithium-ion batteries. Image captured with ClearView camera at 4k x 4k resolution and at 200 kV.
Data courtesy of Danial Zangeneh, University of Illinois Chicago (UIC)

Energy filtering improves SNR for diffraction studies of Catalase

$Energy filtering improves SNR for diffraction studies of Catalase$

Improving MicroED/3DED data quality with post-column energy filter. Selected area diffraction pattern from a single catalase crystal showing the low-resolution diffraction shell acquired without (left) and with energy filtration (right). Both diffraction patterns were collected from the same crystal under identical experimental conditions, except for energy filtration. Exposure was 1.3 s, and slit width of 20 eV was used for the diffraction pattern on the right.

Electron-counted SAED of ZSM-5 with the K3® camera

(left) Selected area diffraction pattern of ZSM-5 was acquired with a 1.3 s exposure without a beam stop. (right) Profile of the diffraction spots showing high SNR for peak intensities varying over three orders of magnitude. Sample courtesy of Dr. Dos Reis, Northwestern University.

Latitude D workflow automates MicroED/3DED data collection and improves throughput

Automate your MicroED/3DED data collection routine: 1) create an atlas; 2) screen crystals; 3) schedule a batch acquisition on good crystals only

MicroED/3DED workflow

MicroED/3DED workflow most commonly includes growing crystals, preparing a TEM grid, screening the specimen and collecting diffraction data, data visualization and processing, and structure building.

Artifact-free selected area electron diffraction of Au particles without beam stop with ClearView

$Artifact-free selected area electron diffraction of Au particles without beam stop with ClearView$

Selected area electron diffraction of Au nanoparticles taken with ClearView camera (4k x 4k, 2 s acquisition, 50 fps) and Spectra 300 at 300 kV.

Large field of view, high resolution imaging of Au particles with ClearView

Au nanoparticles, with fast Fourier transform (FFT) showing 0.9 Å resolution information (dashed line). Captured with ClearView camera (4k x 4k, 5 s acquisition, 15 fps) and Spectra 300 at 300 kV.