TEM & STEM Products

Full in-situ control and data handling within Gatan Microscopy Suite software.

Single and double tilt heating holders for direct observation of microstructural phase changes, nucleation, growth, and dissolution processes.

Optimized for low temperature observation of in-situ phase transitions.

Ideal for low-temperature transfer of frozen-hydrated specimens.

Quantify microstructural changes in materials due to applied mechanical loading.

Optimized for EDS analysis at ambient temperature.

High tilt and dual orientation holders for tomography applications.

Accommodate multiple specimens for increased productivity.

Vacuum storage of holders and specimens, regeneration of cryo-specimen holders.

Preserve sample integrity with controlled transfer from an inert environment to the TEM.

The next generation of advanced systems for EELS & EFTEM.

Electron counting for all your EELS, EFTEM, and energy-filtered 4D STEM applications.

The EELS and EFTEM systems ideal for multiuser facilities, now with the Stela hybrid-pixel option.

The ultimate tool for in-situ electron microscopy

The best-in-class imaging filter for cryo-EM is now available with EELS and EFTEM.

Optimized for cryo-EM and cryo-ET to gain further insight into system function and disease progression at the molecular level.

The most intuitive and easy-to-use energy dispersive spectroscopy (EDS) tool for scanning transmission electron microscope (STEM) applications and in-situ microscopy. 

The world’s first counting, high-speed, large-format camera for in-situ microscopy.

The new imaging performance benchmark for direct detection cameras.

The cutting-edge counting camera for groundbreaking imaging, diffraction, and in-situ studies.

The world’s first direct detection cameras to democratize cryo-EM.

The only fully integrated hybrid-pixel electron detector with the Gatan Microscopy Suite software for advanced electron diffraction studies.

The high-performance scintillator camera that elevates your everyday transmission electron microscopy

Gatan’s latest CMOS camera that with its resolution, speed, and ease of use will revolutionize electron microscopy.

A powerful tool that expands the utility of your Gatan camera to address 4D STEM diffraction studies. 

High-angle annular dark field (HAADF), annular dark field (ADF) plus bright and dark field (BF/DF) detectors for STEM imaging optimized for electron energy loss spectroscopy (EELS).

A powerful method of obtaining detailed analytic data from a sample on an electron microscope equipped with scanning mode.  

Digital beam control and image processing to enhance the photographic quality of your digital images.

Enabling optically-coupled transmission electron microscopy to reveal nanoscale structural, optical, and electronic properties

Sets a new standard for the efficient, high-throughput collection of low-dose, single-particle, cryo-EM datasets from Gatan’s cameras.

Delivers the efficiency and high-throughput data collection that you expect from Latitude software to MicroED studies.

Automates adjustment of focus, astigmatism, and misalignment.

Stage and optics control so you can seamlessly stitch images together.

Facilitate your HREM assays by automatically adjusting the critical imaging parameters of a TEM microscope focus, stigmation, and beam tilt. 

Diffraction analysis package (DIFPACK) to automate the selection area of your electron diffraction (SAED) patterns and high resolution lattice images of crystalline samples.

Computes live phase images from live holograms, allows for live phase unwrapping and provides image stack acquisition and stack processing (including sample and interference-fringe drift correction) enabling high-resolution phase images at the 2pi/1000 level.

Simulation tool to eliminate the guesswork from your EELS and EFTEM compositional mapping experiments.

Automates your multi-element EELS and EFTEM data acquisition experiments.

Precision ion polishing system for precise centering, control, and reproducibility of your milling process.

Fast and reliable mechanical method of pre-thinning to near electron transparency to greatly reduce your ion milling times and uneven thinning.

The next-generation plasma tool to remove hydrocarbon contamination from TEM and SEM samples and holders.

Preferred method for cutting transmission electron microscope (TEM) discs from metals, alloys, and all ductile materials.

Pre-thin and polish your samples to reduce ion milling times and improve quality.

Cut your brittle materials beyond the 3 mm transmission electron microscope (TEM) disc to accurately cut holes or unique shapes.

Ideal for preparing cross sectional transmission electron microscopy (XTEM) samples of semiconductor devices, thin films of various substrates, and composites.

DigitalMicrograph, also known as Gatan Microscopy Suite, drives your digital cameras and surrounding components to support key applications including tomography, in-situ, spectrum and diffraction imaging, plus more.