Streamline specimen preparation and analysis to determine texture, sediment source, degree of compaction, diagenetic history ratio of authigenic, and detrital minerals.
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Measure structural changes that affect electronic conductivities and lead to irreversible phase transformations that decrease your product’s energy output.
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Holzinger, A.; Obwegeser, S.; Andosch, A.; Karsten, U.; Oppermann, C.; Ruth, W.; van de Meene, A.; Goodman, C. D.; Lütz-Meindl, U.; West, J. A
Liting Yang, L.; Li, X.; Pei, K.; You, W.; Liu, X.; Xia, H.; Wang, Y.; Che, R.
Molnár, Z.; Kiss, G. B.; Molnár, F.; Váczi, T.; Czuppon, G.; Dunkl, I.; Zaccarini, F.; Dódony, I.
Ledesma, B.; Beltramone, A.
Giusto, P.; Cruz, D.; Heil, T.; Tarakina, N.; Patrini, M.; Antonietti, M.
Kabir, D.; Forhad, T.; Ghann, W.; Richards, B.; Rahman, M. M.; Uddin, Md. N.; Rakib, R. J.; Shariare, M. H.; Chowdhury, F. I.; Rabbani, M. M.; Bahadur, N. M.; Uddin, J.
Reddy, K. H. P.; Kim, B. -S.; Lam, S. S.; Jung, S. -C.; Song, J.; Park, Y. -K.
Ali, S. M.; Ramay, S. M.; Mahmood, A.; ur Rehman, A.; Ali, G.; Ali, S. D.; Uzzaman, T.
Li, H. -K.; de Souza, J. P.; Zhang, Z.; Martis, J.; Sendgikoski, K.; Cumings, J.; Bazant, M. Z.; Majumdar, A.
He, L.; Ji, Y.; Ren, S.; Zhao, L.; Luo, H.; Liu, C.; Hao, Y.; Zhang, L.; Zhang, L.; Ren, X.
Blades, M. L.; Alessio, B. L.; Collins, A. S.; Foden, J.; Payne, J. L.; Glorie, S.; Holden, P.; Thorpe, B.; Al-Khirbash, S.
Wang, G.; Wang, H.; Wen, J.
Adam, R. E.; Chalangar, E.; Pirhashemi, M.; Pozina, G.; Liu, X.; Palisaitis, J.; Pettersson, H.; Willander, M.; Nur, O.
KAWAKAMI, T.; HORIE, K.; HOKADA, T.; HATTORI, K.; HIRATA, T.
Jenei, I. Z.; Dassenoy, F.; Epicier, T.; Khajeh, A.; Martinic, A.; Uy, D.; Ghaednia, H.; Gangopadhyay, A.
Su, T.; Hood, Z. D.; Naguib, M.; Bai, L.; Luo, S.; Rouleau, C. M.; Ivanov, I. N.; Ji, H.; Qin, Z.; Wu, Z.
Li, X.; Zhang, Z.; Yao, C.; Lu, X.; Zhao, X.; Ni, C.
Persson, I.; Halim, J.; Lind, H.; Hansen, T. W.; Wagner, J. B.; Näslund, L. -A.; Darakchieva, V.; Palisaitis, J.; Rosen J.; Persson, P. O. A.
Persson, I.; Halim, J.; Lind, H.; Hansen, T. W.; Wagner, J. B.; Näslund, L. -A.; Darakchieva, V.; Palisaitis, J.; Rosen J.; Persson, P. O. A.
Jung, H. J.; Kim, D.; Kim, S.; Park, J.; Dravid, V. P.; Shin, B.
Zhang, Z.; Guo, H.; Ding, W.; Zhang, B.; Lu, Y.; Ke, X.; Liu, W.; Chen, F.; Sui, M.
Broad argon ion beam system designed to polish and coat samples for SEM imaging and analytical techniques.
Live color cathodoluminescence imaging for your scanning electron microscope.
DigitalMicrograph, also known as Gatan Microscopy Suite, drives your digital cameras and surrounding components to support key applications including tomography, in-situ, spectrum and diffraction imaging, plus more.
Digital beam control and image processing to enhance the photographic quality of your digital images.
Simulation tool to eliminate the guesswork from your EELS and EFTEM compositional mapping experiments.
Diffraction analysis package (DIFPACK) to automate the selection area of your electron diffraction (SAED) patterns and high resolution lattice images of crystalline samples.
A powerful method of obtaining detailed analytic data from a sample on an electron microscope equipped with scanning mode.
Preserve sample integrity with controlled transfer from an inert environment to the TEM.
Facilitate your HREM assays by automatically adjusting the critical imaging parameters of a TEM microscope focus, stigmation, and beam tilt.
Enabling optically-coupled transmission electron microscopy to reveal nanoscale structural, optical, and electronic properties
The EELS and EFTEM systems ideal for multiuser facilities, now with the Stela hybrid-pixel option.
The high-performance scintillator camera that elevates your everyday transmission electron microscopy
The cutting-edge counting camera for groundbreaking imaging, diffraction, and in-situ studies.
Electron counting for all your EELS, EFTEM, and energy-filtered 4D STEM applications.
The most intuitive and easy-to-use energy dispersive spectroscopy (EDS) tool for scanning transmission electron microscope (STEM) applications and in-situ microscopy.