Imaging Diverse Biological Specimens in a Core Facility
This webinar showcases the Rio camera by presenting data collected from a diverse set of biological specimens in the UC Berkeley Electron Microscope Laboratory.
Addressing Data Challenges for Cryo-EM
This webinar provides information about the underlying computational infrastructure that enables stable operation of a cryo-EM facility.
Observing sample dynamics using in-situ EELS and heating webinar
This webinar will introduce the types of information you can obtain using in-situ EELS. Practical examples will be shown by reviewing published in-situ EELS work as well as unpublished in-situ EELS videos obtained using the GIF Quantum K2 IS system.
4D STEM experiments enabled by high-speed direct electron detectors
In this webinar, we describe the challenges and opportunities created by 4D STEM.
Environmental TEM: Fast is beautiful
This webinar will illustrate some recent results obtained, mainly in the field of nanoparticles in a context of catalysis, using a dedicated Cs-corrected 300 kV ETEM at CLYM (www.clym.fr) in Lyon, France.
Webinar: Practical approaches for in-situ and environmental transmission electron microscopy
During this webinar Dr. Ai Leen Koh will speak about how in-situ transmission electron microscopy (TEM) concerns the examination of dynamic events in a sample under a controlled, externally applied stimulation.
Webinar: Nanocathodoluminescence reveals the optical properties of III-nitride LEDs
During this webinar Dr. Griffiths will describe how nanocathodoluminescence (nanoCL) can reveal the optical properties of individual InGaN quantum wells (QW) in high efficiency light emitting diodes.
Chemical and compositional analysis of 3D NAND and FinFET devices
Learn how the complementary nature of electron energy loss spectroscopy (EELS) and energy dispersive spectroscopy (EDS) signals makes it highly desirable to acquire both during transmission electron microscope (TEM) investigations of materials. With ongoing improvements in electron instrumentation and detectors, it is now practical to acquire joint EELS-EDS spectrum image data for materials analysis all the way from large area mapping down to atomic scale analysis.
Joint EELS–EDS spectrum imaging for fast-mapping and atomic scale analysis
The complementary nature of electron energy loss spectroscopy (EELS) and energy dispersive spectroscopy (EDS) signals makes it highly desirable to acquire both during transmission electron microscope (TEM) investigations of materials. With ongoing improvements in electron instrumentation and detectors, it is now practical to acquire joint EELS/EDS spectrum image data for materials analysis, all the way from large area mapping down to atomic scale analysis.
Optimizing STEM spectrum image acquisition for high speed analysis
STEM EELS spectrum imaging can reveal composition and chemical changes at the nanoscale and even the atomic scale in many cases. To reveal this information, the researcher needs to optimize not only the spectrometer, but also the sample and the STEM configuration. In this webinar, we discuss how to optimize the configuration of the STEM and EELS system for high speed spectrum imaging analysis. Attendees will learn the requirements of EELS camera and spectrometer settings needed to push the limits of spectrum image performance.