PECS II Fully Automated Argon Ion Polishing System | Gatan, Inc.

Advantages:

Fully automated argon ion polishing system suitable for preparation of SEM samples to prepare damage free surfaces, cross sections and deposit coatings to protect or eliminate charging.

Polish, etch or coat samples with a single pump down
Etch at voltages as low as 100 V for rapid and damage free preparation of sample surfaces
Permit samples as large as 32 mm in diameter
Transfer samples from the PECS™ II instrument to a SEM/FIB or glovebox without exposure to air (optional)
Store and analyze image in DigitalMicrograph^® software from Gatan for digital optical imaging
Display and control all PECS II parameters using integrated 10-inch color touch screen

Media Library:

View Media Library

Publications

On the role of transmission electron microscopy for precipitation analysis in metallic materials

Critical Reviews in Solid State and Materials Sciences

2021

Zhou, T.; Babu, R. P.; Hou, Z.; Hedström, P.

Role of extrusion rate on the microstructure and tensile properties evolution of ultrahigh-strength low-alloy Mg-1.0Al-1.0Ca-0.4Mn (wt.%) alloy

Journal of Magnesium and Alloys

2021

Liu, X. Q.; Qiao, X. G.; Pei, R. S.; Chi, Y. Q.; Yuan, L.; Zheng, M. Y.

On the effect of carbon content and tempering on mechanical properties and stiffness of martensitic Fe–18.8Cr–1.8B–xC high modulus steels

Materials Science and Engineering: A

2021

Baron, C.; Werner, H.; Springer, H.

Resources:

Model 685

Datasheet

Applications

Damage-free preparation of a porous Zn alloy with a Cu coating

Removing the oxide layer from magnesium alloys to allow successful EBSD data collection

Specimen surface and thickness effects on EDS mapping

Optimizing the surface of multiphase Al alloys for successful EBSD analysis

Interphase analysis in multiphase CoRe alloy

Protocols

Cleaning guns and cold cathode gauge

Related products

Cipher™ System
DigitalMicrograph^® Software
Ilion^® II System

Firmware

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