Webinar

本ウェビナーでは、空間やスペクトル、そして角度情報、およびそれらを組み合わせたCLデータ解析の重要性に焦点を当てます。CLデータ解析の重要性はデータ取得時のそれに匹敵するものであり、構成元素の濃度や分布、欠陥密度、プラズモニックやフォトニックモードなど、試料の多くの興味深い特性を明らかにすることが出来ます。本ウェビナーでは、様々な試料に対するデータ解析を実際に行い、結果を考察、そしてそのような解析のメリットについてデモンストレーションを行います。本ウェビナーを通じて、どのようにご自身の試料に対してご覧頂いた解析手法を適用するべきかご理解頂くことが出来ます。

In this webinar, we covered many examples of usage of direct detection cameras at Northwestern University, from the imaging of soft materials to special applications of 4D-STEM in hybrid interfaces. In particular, we covered the performance of the new Gatan K3 IS, which allows the acquisition of in-situ imaging and 4D STEM data in counted mode with high temporal resolution.

PRESENTER: Roberto dos Reis, Ph.D.
Department of Materials Science and Engineering, Northwestern University

In this webinar, we will review the different hardware and analysis modes available in CL detectors, discussing the benefits and drawbacks of each when analyzing geoscience specimens.

In this webinar, the second in our series on Cathodoluminescence, we discuss how simultaneous measurement of wavelength and direction can be used to reveal the light extraction and color rendering of a display device (in this case micro-LED array) as a function of viewing angle.

In this webinar Josh Kacher, from Georgia Tech, discussed the work his group is doing in applying advanced multiscale and multimodal electron-microscopy based characterization techniques to understand mechanical deformation and failure processes. He focused his results on two materials applications: understanding the influence of second phase particles in ductile failure of Al alloys and determining the role of processing conditions in strain localization during cyclic loading of additive manufactured alloys.

This webinar illustrates the application of core-loss and low-loss EELS for in situ materials characterization. Observations of in situ reductions, vacancy ordering, and gas-solid interactions can all be characterized with in situ STEM EELS. Aloof beam EELS approaches can be useful for probing near surface regions especially for systems susceptible to electron beam damage.

This webinar serves as an introduction to the CL technique and key application challenges addressed by CL highlighting some of the latest research from the world of nanophotonics, micro-LED device development and microanalysis.