The STEMPack™ 3 system utilizes the next-generation digital image acquisition performance of the DigiScan™ 3 for advanced spectrum imaging (SI) applications. Using the high-performance and flexible scanning of the DigiScan 3, STEMPack 3 provides the link between electron energy loss spectroscopy (EELS) and probe scanning to allow the collection of spectrum image data sets. The STEMPack 3 system provides the backbone behind all spectrum imaging applications from Gatan, creating a unified user experience for all modalities (e.g., EELS, EDS, diffraction, CL).
- Provides a systematic and unbiased sampling of specimen properties
- Maximizes analytical specimen information for a given dose
- Detailed EELS data is amenable to advanced chemical mapping techniques based on fine structure analysis
- Delivers rich, unbiased data ideally suited to powerful techniques like principal component and multivariate statistical analysis
- Enables simultaneous multiple signal acquisition* and unique contrast modes
* May require optional components
For more information about EELS techniques, step-by-step instructions on analytical experiments, and access to downloadable spectra, please visit EELS.info, an educational site dedicated to supporting the EELS community.
Models 877, 878
Datasheet
Fast simultaneous acquisition of low- and core-loss regions in the EELS spectrum from catalyst particles containing the heavy metals Au and Pd
Atomic-level EELS mapping using high energy edges in DualEELS™ mode
High speed EELS composition analysis, in DualEELS mode, of metal alloy ohmic contacts for the fabrication of III-V MOSFET devices
Configurations
STEMPack 3 System, model 877
STEMPack 3 Max System, model 878
DigiScan 3 Input Expansion, model 888.U4
DigiScan 3 Fiber Optic Data Link Expansion, model 888.UFO
STEMx® System Upgrade for STEMPack 3, model 1020.DS3.2
STEMPack High-Speed EDS Acquisition Upgrade, model 777.U3
System configuration, requirements, and limitations exist. Please contact your Gatan representative for complete details.