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STEMPack Spectrum Imaging

A powerful method of obtaining detailed analytic data from a sample on an electron microscope equipped with scanning mode.  

The STEMPack™ 3 system utilizes the next-generation digital image acquisition performance of the DigiScan™ 3 for advanced spectrum imaging (SI) applications. Using the high-performance and flexible scanning of the DigiScan 3, STEMPack 3 provides the link between electron energy loss spectroscopy (EELS) and probe scanning to allow the collection of spectrum image data sets. The STEMPack 3 system provides the backbone behind all spectrum imaging applications from Gatan, creating a unified user experience for all modalities (e.g., EELS, EDS, diffraction, CL).
 

  • Provides a systematic and unbiased sampling of specimen properties
  • Maximizes analytical specimen information for a given dose
  • Detailed EELS data is amenable to advanced chemical mapping techniques based on fine structure analysis
  • Delivers rich, unbiased data ideally suited to powerful techniques like principal component and multivariate statistical analysis
  • Enables simultaneous multiple signal acquisition* and unique contrast modes

* May require optional components

For more information about EELS techniques, step-by-step instructions on analytical experiments, and access to downloadable spectra, please visit EELS.info, an educational site dedicated to supporting the EELS community.

Configurations

STEMPack 3 System, model 877 
STEMPack 3 Max System, model 878
DigiScan 3 Input Expansion, model 888.U4
DigiScan 3 Fiber Optic Data Link Expansion, model 888.UFO
STEMx® System Upgrade for STEMPack 3, model 1020.DS3.2
STEMPack High-Speed EDS Acquisition Upgrade, model 777.U3
 

System configuration, requirements, and limitations exist. Please contact your Gatan representative for complete details.

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