Workshop on Advances in Sample Preparation, High-Resolution Imaging, and Spectroscopy
Join Gatan, JEOL, and the Technical University of Munich (TUM) for our upcoming workshop on transmission electron microscopy (TEM) sample preparation, electron counting imaging methods, and analytical microscopy. During this event, you will spend time with leading experts from academia and industry to explore the new possibilities in automated sample preparation and to advance your practical skills necessary to move your routine and advanced TEM and electron energy loss spectroscopy (EELS) studies forward.
Presentations from expert users will be complemented by live-demos with application specialists from Gatan and JEOL, showcasing these techniques on JEOL’s new focused ion beam (FIB) PS500i and the analytical F200 located at the TUM, featuring direct detection and in-situ EELS, energy-filtered 4D STEM, and many more capabilities.
During this three-day event, you will participate in live FIB and TEM demonstrations and sessions with resident experts. Participants are encouraged to send samples which may be considered for analysis before, during, or after the workshop.*
Preliminary agenda (subject to change):
Tuesday, June 18
| Time | Topic |
| 1:00 – 5:00 p.m. |
FIB focus:
|
| 6:00 – 9:00 p.m. | Dinner, provided courtesy of JEOL GmbH |
Wednesday, June 19
| Time | Topic |
| 9:00 a.m. – 12:00 p.m. |
TEM focus:
|
| 12:00 – 1:00 p.m. | Lunch, provided courtesy of JEOL GmbH |
| 1:00 – 1:45 p.m. | Introduction to Counted EELS, energy-filtered 4D STEM, and in-situ analytical techniques – Ray Twesten, Gatan |
| 1:45 – 2:15 p.m. | Invited speaker: Michael Stöger-Pollach, Vienna University of Technology |
| 2:15 – 3:00 p.m. | Invited speaker: Marc Willinger, Technical University Munich |
| 3:00 – 3:15 p.m. | Coffee break |
| 3:15 – 4:00 p.m. | Live demo of high-throughput direct detection EELS – Saleh Gorji, Gatan |
| 4:00 – 4:45 p.m. | Live demo of energy filtered 4D STEM using GIF® Continuum® – Ana Pakzad, Gatan |
| 4:45 – 5:00 p.m. | Wrap up |
| 6:00 – 9:00 p.m. | Dinner, provided courtesy of AMETEK GmbH |
Thursday, June 20
Course 1: Direct detection EELS and energy-filtered 4D STEM featuring GIF Continuum K3®, Stela®**, and STEMx® systems on JEM F200 (at TU Munich in Garching)
| Time | Topic |
| 9:00 a.m. – 12:00 p.m. | Hands-on demonstration for direct detection EELS, including samples submitted by attendees* |
| 9:00 a.m. – 12:00 p.m. | Best practices for EELS in DigitalMicrograph® 3.6 |
| 12:00 – 1:00 p.m. | Lunch |
| 1:00 – 5:00 p.m. | Hands-on demonstration for energy-filtered 4D-STEM, including samples submitted by attendees* |
| 1:00 – 5:00 p.m. | Best practices for 4D STEM collection and analysis in DigitalMicrograph 3.6 |
Course 2: Automated FIB preparation, extraction, and best practices on JEOL JIB-PS500i (at JEOL GmbH in Freising)
| Time | Topic |
| 9:00 a.m. – 12:00 p.m. | FIB individual hands-on demonstration |
| 12:00 – 1:00 p.m. | Lunch |
| 1:00 – 5:00 p.m. | FIB individual hands-on demonstration |
*Samples may be considered for evaluation as part of this workshop. Interested attendees should contact jordan.moering@ametek.com by 31 May for consideration.
**Stela utilizes DECTRIS hybrid-pixel technology.
Registration and catering for this in-person event are free, but seats are limited.