Results courtesy of Dr. Francois Brisset and Yoann Angilella of Electron Microscopy Department, ICMMO, CNRS- University of Paris- Sud. Data acquired with a Zeiss Supra & Sigma HD and EBSD with Hikari XP and OIM from TSL-EDAX. TRIP steel results prepared on PECS II system A. Secondary electron; (B) EBSD image quality map; (C) IPFZ map
