Joint EELS–EDS spectrum imaging for fast-mapping and atomic scale analysis

The complementary nature of electron energy loss spectroscopy (EELS) and energy dispersive spectroscopy (EDS) signals makes it highly desirable to acquire both during transmission electron microscope (TEM) investigations of materials. With ongoing improvements in electron instrumentation and detectors, it is now practical to acquire joint EELS/EDS spectrum image data for materials analysis, all the way from large area mapping down to atomic scale analysis.

In this webinar, we will discuss the instrumentation needed for efficient joint EELS/EDS spectrum image acquisition in the scanning transmission electron microscope (STEM). We will draw from catalysts, electronic devices and complex oxides applications to illustrate how the low background signal from x-ray data can complement the high signal to noise ratio and chemical bond sensitivity of energy loss data.