Introducing ClearView®, the high-performance scintillator camera that elevates your everyday transmission electron microscopy (TEM). With ClearView, everyone can capture impactful in-situ and 4D STEM data at framerates faster than any other scintillator camera on the market. New camera imaging modes make it easy to capture the highest-quality images from materials science and biological samples.
- Capture images with the highest quality: New CMOS sensor features always-on high dynamic range sensor readouts to acquire 4k x 4k images and video at 50 frames per second (fps)
- Record in-situ video and 4D STEM data at the highest speeds of any scintillator camera: Acquire data up to 1,600 fps at 256 x 256 resolution to record fast in-situ reactions or analyze large areas quickly with 4D STEM
- Maximize signal-to-noise for low-contrast imaging and diffraction: New enhanced frame exposure imaging mode integrates less read noise to better resolve subtle image and diffraction features under low-dose conditions
- Achieve the desired frame rate and data rate for any technique or experiment: Control image size and field of view with new sensor subarea region of interest readout options
- Integrates with eaSI technology for the most efficient multidimensional and multimodal experiments: Acquires 4D STEM data linked with elemental data from complimentary detectors
In-situ option
- Image binning increases framerate by 4x, and sensor sub-area readouts increase framerate by up to 8x
- Combine binning with sub-area readout to reach up to 1,600 fps and study sub-ms in-situ reactions
- Never miss the start of a reaction with LookBack™, a post-event triggered video buffer to ensure events are captured from the start
- Confidently record long experiments with TimeLapse, which saves data at a longer interval of time or number of frames
- Process data from start to finish in DigitalMicrograph® using tools for drift correction, video editing, and data exporting
Low distortion option
- Guarantees high-resolution, low-distortion images for quantitative spatial measurements on your TEM
- Improved fiber-optic coupling and imaging performance minimize camera distortions
- Low camera distortion offers a greater margin to achieve total distortion specification for regular TEM qualification
Strain effects in SrHfO3 films grown by hybrid molecular beam epitaxy
Applications
Frame Control mode for optimized imaging and diffraction with ClearView camera |
Model 1195
Datasheet
ClearView Camera
ClearView Service Plans
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