Atomic level EELS prepared in PIPS II system following FIB preparation (image 2)
Data courtesy of Dr. Phil Rice and Dr. Teya Topuria, IBM, San Jose, CA
Atomic level EELS prepared in PIPS II system following FIB preparation
Data courtesy of Dr. Phil Rice and Dr. Teya Topuria, IBM, San Jose CA
AlPb melt-spun ribbon with 1 - 3% at wt Ga HR-STEM using TEAM 0.5
Data courtesy of Anna Moros, Prof. Dr. Gerhard Wilde research group, Institute of Materials Physics, University of Muenster
Ca3Co4O9 on SrTiO3 substrate
Data courtesy of Hanns-Ulrich Habermeier and Petar Yordanov, Max Planck Institute for Solid State Research, Stuttgart
TEM sample preparation and HRTEM image using a JEOL 4000FX TEM courtesy of Marion Kelsch and Peter A. van Aken, Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Stuttgart
Sample La23Sr13MnO3 + 30% ZrO2 on LaAlO3 substrate
Data courtesy of Hanns-Ulrich Habermeier and Yuze Gao, Max Planck Institute for Solid State Research, Stuttgart
TEM sample preparation and HRTEM image using a JEOL 4000FX TEM courtesy of Marion Kelsch and Peter A. van Aken, Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Stuttgart
Surface plasmon resonance modes
Cathodoluminescence spectrum-imaging of a gallium arsenide (GaAs) nanowire
Data courtesy of Dr. U. Jahn, Paul-Drude-Institut für Festkörperelektronik.
Cathodoluminescence spectrum imaging of polycrystalline diamond
Data courtesy of Dr. E. Vicenzi, Smithsonian Institute
EBSD inverse pole figure map of copper sample
Data courtesy of Evans Analytical Group, Sunnyvale, CA