Nanoscale characterization of Li metal batteries enabled by cryogenic lift-out
Developing methods for electron-transparent specimens without inducing artifacts has become significantly important for the high-resolution characterization of battery materials. We will introduce our recent approach (cryogenic-lift-out) to generate lamellae with cryogenic ion microscopy and talk about the effects of xenon ion beam on lithium metal batteries through the usage of cryogenic (S)TEM. We will also show the capability of a Metro direct detection counting camera to pull out the diffraction information that helps to identify the ion beam effect. We will finally discuss how the lift-out approach benefits high-resolution characterization of battery materials beyond lithium metal batteries.
Presenter: Hyeongjun Koh, Stach Group, University of Pennsylvania