Publications

Probing oxidation-driven amorphized surfaces in a Ta(110) film for superconducting qubit

ACS Nano

2023

Mun, J.; Sushko, P. V.; Brass, E.; Zhou, C.; Kisslinger, K.; Qu, X.; Liu, M.; Zhu, Y.

Direct observation of single-atom defects in monolayer two-dimensional materials by using electron ptychography at 200 kV acceleration voltage

Scientific Reports

2024

Chen, Y.; Chou, T. -C.; Fang, C. -H.; Lu, C. -Y.; Hsiao, C. -N.; Hsu, W. -T.; Chen, C. -C.

High-resolution single particle imaging at 100-200 keV with the Gatan Alpine direct electron detector

bioRxiv

2024

Chan, L. M.; Courteau, B. J.; Maker, A.; Wu, M.; Basanta, B.; Mehmood, H.; Bulkley, D.; Joyce, D.; Lee, B. C.; Mick, S.; Gulati, S.; Lander, G. C.; Verba, K. A.

Multi-convergence-angle ptychography with simultaneous strong contrast and high resolution

arXiv

2024

Mao, W.; Zhang, W.; Huang, C.; Zhou, L.; Kim, J. S.; Gao, S.; Lei, Y.; Wu, X.; Hu, Y.; Pei, X.; Fang, W.; Liu, X.; Song, J.; Fan, C.; Nie, Y.; Kirkland, A. I.; Wang, P.

Obtaining high-resolution cryo-EM structures using a common LaB6, 120-keV electron microscope equipped with a sub 200-keV optimised direct electron detector

bioRxiv

2024

Venugopal, H.; Mobbs, J.; Taveneau, C.; Fox, D. R.; Vuckovic, Z.; Knott, G.; Grinter, R.; Thal, D.; Mick, S.; Czarnik, C.; Ramm, G.

Probing oxidation-driven amorphized surfaces in a Ta(110) film for superconducting qubit

Direct observation of single-atom defects in monolayer two-dimensional materials by using electron ptychography at 200 kV acceleration voltage

High-resolution single particle imaging at 100-200 keV with the Gatan Alpine direct electron detector

Multi-convergence-angle ptychography with simultaneous strong contrast and high resolution

Obtaining high-resolution cryo-EM structures using a common LaB6, 120-keV electron microscope equipped with a sub 200-keV optimised direct electron detector

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