Paolo Longo, Ph.D., Gatan, Inc. Sample courtesy of by Dr. P. Rice and Dr. T. Topuria at IBM (Almaden), San Jose CA Microscope courtesy of Dr. P. Rice and Dr. T. Topuria at IBM (Almaden), San Jose CA Acknowledgements to Dr. P. Rice and Dr. T. Topuria at IBM (Almaden), San Jose, CA for helping set up microscope for experiment.

SrTiO3/LaFeO3/LaCuOx interfaces

Methods

probe-corrected Jeol ARM 200 TEM/STEM microscope
C-FEG emission gun
GIF Quantum^® ER system
Sr L at 1940 eV (red); Ti L at 456 eV (green); Fe L at 708 eV (amber); La M at 832 eV (blue); Cu L at 931 eV (purple)
voltage: 200 kV
data taken in STEM mode
EELS core-loss spectrum (300 – 2300 eV): 5 ms
EDS spectrum (0 – 20 keV): 5 ms
beam current: 200 pA
dataset size: 416 x 104 pixels
total exposure time: 4 min