OneView wins Microscopy Today Innovation Award at M&M 2015

Posted: 
August 26, 2015

The OneView® camera was awarded the 2015 Microscopy Today Innovation Award at the recent Microscopy and Microanalysis conference in Portland, the premiere microscopy event for 2015. This prestigious award honors innovative microscopy-related products and methods that provide new insight and enhance the microscopy workflow.

The OneView camera takes a critical step forward to simplify the TEM workflow so that discoveries can be made earlier. Notable workflow changes include:

  •          No longer requires researchers to compromise speed for image quality
  •          Ensures researchers never miss the start of an in-situ reaction
  •          Enables evaluation of beam-sensitive materials through the reduction of charging artifacts and image“blurring” associated with sample drift
  •          Simplifies image capture to deliver consistent results with no additional time spent on image processing

These unique innovations led Microscopy Today to recognize the OneView camera in the area of electron microscopy because it “will make microscopy and microanalysis more powerful, more flexible, more productive, and easier to accomplish.”  Gatan offered live demonstrations of the camera at the conference, showcasing these capabilities (such as real-time drift correction of images).

OneView is the second Gatan product awarded a Microscopy Today Innovation Award, following the K2® Summit direct detection camera that received this honor in 2012.

 

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Jennifer McKie
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jennifer.mckie@ametek.com