パブリケーション

301 - 310 of 439 publications
CSV

Influenza A and B virus-like particles produced in mammalian cells are highly immunogenic and induce functional antibodies

Vaccine
2019

Buffin, S.; Peubez, I.; Barrière, F.; Nicolaï, M., -C.; Tapia, T.; Dhir, V.; Forma, E.; Sève, N.; Legastelois, I.

Design strategies for efficient nonstoichiometric mixed metal oxide electrocatalysts: Correlating measurable oxide properties to electrocatalytic performance

ACS Catalysis
2019

Samji Samira, S.; Gu, X. -K.; Nikolla, E.

Cryo-EM structure of the bacterial Ton motor subcomplex ExbB–ExbD provides information on structure and stoichiometry

Communications Biology
2019

Celia, H.; Botos, I.; Ni, X.; Fox, T.; De Val, N.; Lloubes, R.; Jiang, J.; Buchanan, S. K.

Large piezoelectric coefficient with enhanced thermal stability in Nb5+-doped Ba0.85Ca0.15Zr0.1Ti0.9O3 ceramics

Ceramics International
2019

He, L.; Ji, Y.; Ren, S.; Zhao, L.; Luo, H.; Liu, C.; Hao, Y.; Zhang, L.; Zhang, L.; Ren, X.

Electron microscopy techniques to study structure/function relationships in catalytic materials

Advanced Catalytic Materials: Current Status and Future Progress
2019

Mayoral, Á.; del Angel, P.; Ramos, M.

Unravelling the neoproterozoic accretionary history of Oman, using an array of isotopic systems in zircon

Journal of the Geological Society
2019

Blades, M. L.; Alessio, B. L.; Collins, A. S.; Foden, J.; Payne, J. L.; Glorie, S.; Holden, P.; Thorpe, B.; Al-Khirbash, S.

Electron beam-induced current imaging with two-angstrom resolution

Ultramicroscopy
2019

Mecklenburg, M.; Hubbard, W. A.; Lodico, J. J.; Regan, B. C.

Identification of interstratified mica and pyrophyllite monolayers within chlorite using advanced scanning/transmission electron microscopy

American Mineralogist
2019

Wang, G.; Wang, H.; Wen, J.

Solid-solution hardening of WC by rhenium

Journal of the European Ceramic Society
2019

Zhao, C.; Lu, H.; Wang, H.; Tang, F.; Nie, H.; Hou, C.; Liu, X.; Song, X.; Nie, Z.

Plasma profiling time-of-flight mass spectrometry for fast elemental analysis of semiconductor structures with depth resolution in the nanometer range

arXiv.org
2019

Spende, H.; Margenfeld, C.; Meyer, T.; Clavero, I. M.; Bremers, H.; Hangleiter, A.; Seibt, M.; Waag, A.; Bakin, A.

Pages