- X,Y stage permits alignment of argon beams to the region of interest on the sample
- Improved collimated beam provides useable voltages as low as 100 volts for rapid and damage-free preparation of FIB lamella
- Digital optical imaging with image storage and analysis in DigitalMicrograph® software
- 10" color touch screen for display and control of all PIPS™ II parameters
Model 695
Datasheet
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