Fully automated argon ion polishing system suitable for preparation of SEM samples to prepare damage-free surfaces, cross sections, and deposit coatings to protect or eliminate charging.
- Polish, etch, or coat samples with a single pump down
- Etch at voltages as low as 100 V for rapid and damage-free preparation of sample surfaces
- Permit samples as large as 32 mm in diameter
- Transfer samples from the PECS™ II instrument to a SEM/FIB or glovebox without exposure to air (optional)
- Store and analyze images in DigitalMicrograph® software from Gatan for digital optical imaging
- Display and control all PECS II parameters using an integrated 10-inch color touchscreen
Model 685
Datasheet
Damage-free preparation of a porous Zn alloy with a Cu coating
Removing the oxide layer from magnesium alloys to allow successful EBSD data collection
Specimen surface and thickness effects on EDS mapping
Optimizing the surface of multiphase Al alloys for successful EBSD analysis
