Images were captured from a Ge nanowire specimen using the OneView camera, with drift correction on and off. Collecting high quality images of these specimens with out drift correction is very challenging as samples change and move under the electron beam.
Sample: Ge nanowire; beam energy: 300 kV; image size: 4k x 4k; exposure: 1 s; number of frames: 25; drift correction: no (left) and yes (right)
Sample courtesy of Dr. Ann Marshall, Stanford University
