TEM analytical holders are designed for basic imaging and analytical applications, such as electron diffraction and energy dispersive x-ray spectroscopy (EDS) analysis of crystalline TEM specimens.
- A beryllium specimen cradle minimizes unwanted x-ray signals
- Cut-outs in the specimen tip are matched to the TEM configuration and provide a clear path between the sample and detector to reduce shadowing for EDS analysis
- To facilitate quantitative x-ray analysis, non-rotating holder versions are equipped with a small Faraday cup located near the specimen cradle at the tip of the holder
- Electrical connections are available for the non-rotating versions of the holder
| Model number | Beryllium cradle | Specimen positioning | Specimen securing | Motorized control | Faraday cup | Max. electrical feed-throughs (optional) |
|---|---|---|---|---|---|---|
| 643 | Standard | α tilt | Hexring® mechanism | Standard | 6 | |
| 646 | Standard | α, β Tilt | Hexring | β Tilt | Standard | 4 – 61 |
| 650 | Standard | α Tilt and rotation | Hexring | Rotation | No | 0 |
| 925 | Standard | α, β Tilt and rotation1 | Hexring | No | 0 |
1 2 – 6 for JEOL UHR, 2 – 4 for all other EMMs
Models 643, 646, 650, 925
Related Products
Cooling In-Situ Holders
Optimized for low-temperature observation of in-situ phase transitions.
EDAX Elite T EDS Systems
The most intuitive and easy-to-use energy dispersive spectroscopy (EDS) tool for scanning transmission electron microscope (STEM) applications and in-situ microscopy.
Heating In-Situ Holders
Single and double tilt heating holders for direct observation of microstructural phase changes, nucleation, growth, and dissolution processes.
Multiple Specimen Holders
Accommodate multiple specimens for increased productivity.
Straining In-Situ Holders
Quantify microstructural changes in materials due to applied mechanical loading.
Do you need a unique specimen holder for your application? Click the request quote button to discuss the application with your local sales representative.