Review of recent advances in spectrum imaging and its extension to reciprocal space

Read about RECENT ADVANCES IN SPECTRUM IMAGING

Review of Recent Advances in Spectrum Imaging and Its Extension to Reciprocal Space

Gatan Analytical TEM experts publish a new review article on current spectrum imaging techniques and applications in the April 2009 special issue of the Journal of Electron Microscopy

Alain Maigne and Ray Twesten, two principals of Gatan's Analytical TEM group, authored a key review paper covering "recent developments in spectrum imaging (SI) using scanning transmission electron microscopy (STEM) and electron energy loss spectroscopy (EELS). Advanced multi-dimensional acquisition methods allow the acquisition of STEM–EELS data with other complementary data such as energy dispersive X-ray spectroscopy (EDS), cathodoluminescence and even combining them with reciprocal space analysis through a new method called diffraction imaging."

The paper, entitled Review of recent advances in spectrum imaging and its extension to reciprocal space, was published on April 27, 2009 in a special issue of the Journal of Electron Microscopy [Journal of Electron Microscopy: 1–11 (2009)]. For an electronic copy of this paper please go to: http://jmicro.oxfordjournals.org/cgi/reprint/dfp022?ijkey=xhuYhhk5IDzAtps&keytype=ref.

For questions and correspondence, please email Alain Maigne at: amaigne@gatan.com. For information on Gatan's Analytical TEM products, please click here.

Reference:
Special number: History/Review: Review of recent advances in spectrum imaging and its extension to reciprocal space.
Alan Maigne¹,∗ and Ray D. Twesten²
Journal of Electron Microscopy: 1–11 (2009). [doi: 10.1093/jmicro/dfp022]
¹Gatan Inc., 3F Sakurai Building, 2-8-19 Fukagawa, Koto-ku, Tokyo 135-0033, Japan and ²Gatan, Inc., 5794 W. Las Positas Blvd., Pleasanton, CA 94588, USA
∗To whom correspondence should be addressed. E-mail: amaigne@gatan.com

© The Author 2009. Published by Oxford University Press on behalf of Japanese Society of Microscopy. All rights reserved. For permissions, please e-mail: journals.permissions@oxfordjournals.org