Transmission electron microscope (TEM) multiple specimen holders increase productivity for applications requiring comparable screening of multiple specimens.
- Operates at ambient temperature or cryo-temperature, depending on the holder model
- Interchangeable cartridge design facilitates the handling and storage of fragile specimens
- Opening on one side of FIBBEM™ cartridges allows access to the ion beam and reactive gasses to interact with the samples; the cartridge can then be attached to the holder for viewing in the TEM
| Model number | Specimen positioning | Specimen securing | Interchangeable cartridge | Operating temperature |
|---|---|---|---|---|
| 677 | α Tilt | Hexring® mechanism | Yes1,2 | Ambient |
| 677.FIB | α Tilt | FIBBEM cartridge | Yes1 | Ambient |
1 Two specimen positions are available in holders for the Hitachi and Zeiss TEMs. Three specimen positions are available in holders for FEI and Topcon TEMs. Five specimen positions are available in holders for the JEOL TEMs.
2 Small pole piece gap configuration does not have a removable cartridge.
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