Developing methods for electron-transparent specimens without inducing artifacts has become significantly important for the high-resolution characterization of battery materials. During this webinar, we introduced our recent approach (cryogenic-lift-out) to generate lamellae with cryogenic ion microscopy and talked about the effects of xenon ion beam on lithium metal batteries through the usage of cryogenic (S)TEM. We also showed the capability of the Metro direct detection counting camera to pull out the diffraction information that helps to identify the ion beam effect.