Atomic level EELS prepared in PIPS II system following FIB preparation (image 2)

Atomic level EELS prepared in PIPS II system following FIB preparation (image 2)
Data courtesy of Dr. Phil Rice and Dr. Teya Topuria, IBM, San Jose, CA

Fast atomic EELS analysis GaN/InGaN multi-layers sample preparation with PIPS II system and analysis with Gatan EELS product.