- Provides simple and accurate measurements of lattice spacings and the angle between two sets of lattice planes
- Automatically tracks all measurements in different images and provides output that can be easily exported to any word processor or plotting applications
- Ideal tool for performing high-precision magnification calibration
- Accurate peak location—Automatic peak search and refinement to sub-pixel accuracy through the use of center of mass calculation (for diffraction patterns) and interpolation (for diffractograms)
- Improved diffractogram—Calculation of the diffractogram of a lattice image is preceded by masking in real space to eliminate streaking and improve measurement accuracy
- Optimized calibration—Calibrations are automatically transferred between the image and its diffractogram
- Center location—Center of the diffraction pattern can be automatically located using a cross-correlation technique (for centro-symmetrical patterns) or be determined manually from a pair of spots located symmetrically about the central spot
- Background thresholding—Background noise can be automatically distinguished from dim spots through the use of an empirically determined threshold parameter
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